XRF Analyzer


The X-50 features PiN diode technology, which is the previous generation detector prior to the advent of silicon drift detectors. The PiN technology processes a factor of 10x - 20x lower X-ray rates than the silicon drift detectors, and has resolution that is about 100 eV less (greater width). However for many applications such as basic sorting of stainless, high temp and copper alloys, or analyze base or heavy metals in soils, ores, powders, etc. the PiN technology is satisfactory.



Key Specifications
X-Ray Tube 40 kV, Rh anode (alloy) or Au anode (Geochem, Soil, others)
Detector, Rate 7 mm2 PIN Diode, Standard DPP, 15k cps, 50% live
Weight 3.3 lbs with battery
Power On board rechargeable Li-ion battery, rechargeable inside device or with external charger, AC power, hot-swap capability (60s max swap time)
Display 5″ color touchscreen Smartphone type display – PowerVR SGX540 3D graphic
Excitation Source 6-40kV, 200uA Rh anode for alloy testing, 6-50kV, 200uA Au anode for most other Apps